Orbis PC Micro-XRF Analyzer

Description:

Offers advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

Features:

Three different spot sizes: 30μm, 1mm, 2mm
Sample chamber: vacuum or air
High precision computer-controlled XYZ stage
Dual CCD video
Automated primary beam filter system
Advanced 30mm² Silicon Drift Detector (SDD), no liquid cryogen cooling required

Location

AML 274

User Rates

Internal Assisted	$80/hour
Internal Trained	$60/hour
External Assisted	$120/hour
External Trained	$90/hour

Scheduling

To schedule time on this instrument or to learn more about its capabilities and user fees, etc. please contact: