JEOL 2010

High Resolution Transmission Electron Microscope (HRTEM)

Description

JEOL 2010 200kV high-resolution transmission electron microscope is capable of a 0.19 nm point-to-point resolution. The instrument is fitted with a GATAN Orius high speed CCD camera for digital image acquisition. The EDS system on this instrument is a new Oxford INCA system with an ultra thin window EDS detector capable of detecting all elements down to boron.

Specifications:

Acceleration Voltage: 200kV
Beam source: LaB₆
Point to point resolution: 0.19 nm
Lattice resolution: 0.14 nm
Tilt Range: ± 15°

User Rates (Contact NCF, or refer to their rates)

Internal Assisted	$80/hour
Internal Trained	$50/hour
External Assisted	$200/hour
External Trained	$135/hour

Location

Northrop Hall Room B04

Scheduling

To schedule time on this instrument or to learn more about its capabilities and user fees, etc. please contact: