Panalytical X'Pert PRO
Announcement
Facility coming soon with a new instrument for diffraction analysis.
Description
PANalytical X'Pert PRO is a multi-purpose diffractometer for powder sample or thin-film sample analysis, employing a Cu source. More ...
Location
AML 182
For details, user rates, or further information please contact:
Angelica Benavidez
Research Assistant Professor, Center for Micro Engineered Materials, Chemical & Biological Engineering
505-277-2304
asanch18@unm.edu