Panalytical X'Pert PRO


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Description

PANalytical X'Pert PRO is a multi-purpose diffractometer for powder sample or thin-film sample analysis, employing a Cu source.

Location

AML 182

 

For details, user rates, or further information please contact:

Angelica Benavidez
Research Assistant Professor, Center for Micro Engineered Materials, Chemical & Biological Engineering 
505-277-2304
asanch18@unm.edu