JEOL 2010F

Scanning Transmission Electron Microscope (HRTEM/STEM) with Field Emission Gun

Description

This instrument has an exceptional array of analytical capabilities including energy filtered imaging (EFTEM), electron energy loss spectroscopy (EELS), X-ray microanalysis and X-ray mapping at the sub-nm level, and bright- and dark-field STEM imaging, as well as traditional TEM techniques such as electron diffraction and high-resolution imaging. It also has a high-angle annular dark-field detector (HAADF) for atomic resolution Z-contrast imaging in the STEM mode. Our instrument is also equipped with a GATAN image filtering (GIF) system for energy-filtered TEM (EFTEM) and electron energy loss spectroscopy (EELS), and an Oxford AZTEC 80 mm² SDD EDS with ultrathin window. The instrument also has a GATAN TV camera for instrument alignment and a GATAN multiscan CCD camera (as integral part of the GIF) for digital image acquisition. We added a GATAN ES500W 27 Erlangshen wide-field camera to the instrument to facilitate the acquisition of digital electron diffraction patterns. The JEOL FASTEM interface allows complete and remote operation of all the microscope parameters via a Windows 2000 computer. The instrument can produce a high-brightness 1nm diameter probe and has an information limit of about 0.1nm, which permits simultaneous high-resolution imaging and nanometer-level spectroscopic analysis.

Specifications:

Acceleration Voltage: 200kV
Beam source: Schottky field emission gun (zirconated tungsten)
Point to point resolution: 0.19 nm
Lattice resolution: 0.14 nm
Scanning TEM resolution: 0.17nm (HAADF detector)
Tilt Range: ± 15°

User Rates (Contact NCF, or refer to their rates)

Internal Assisted	$95/hour
Internal Trained	$65/hour
External Assisted	$300/hour
External Trained	$200/hour

Location

Northrop Hall Room B06

Scheduling

To schedule time on this instrument or to learn more about its capabilities and user fees, etc. please contact: