SEM, JEOL-5800LV with EDS

Scanning Electron Microscopy (SEM) @ UNM


Has resolution of 3.0nm in high vaccum mode and 4.5nm in the low vaccum mode. Voltage range is 0.3kv-30kv.Can work under pressures of upto 200 milliTorr. The low vacuum mode allows imaging and analysis of samples that do not have to be dried and coated before hand. This is particularly useful for handling "wet" samples such as soil, sandstone, and clay.

Related Links

Instrument Location

Scanning Electron Microscopy User Rates

Scheduling and Contact

To schedule time on this instrument or to learn more about its capabilities and user fees, etc. please contact:

Hien Pham, Research Assistant Professor, Ceramic and Composite Materials Center; Chemical & Nuclear Engineering


Tito Busani, Nanoscience Lab Manager