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SEM, JEOL-5800LV with EDS
Hitachi S-5200 Nano SEM
Quartz PCI Image Server
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TEM Facilities
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JEOL 2010 FEG TEM STEM with Oxford EDS, Gatan Imaging Filter and EEL Spectrometer
JEOL 2010 EX HREM with Oxford-Link EDS, Gatan Digital Micrograph equipped with slow CCD Camera
Focused Ion Beam /Scanning Electron Microscope
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Scintag Pad V Diffractometer
Philips double and triple crystal XRD
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